Conference Sessions 
1.Interometric Techniques I 
    Congress-wide Plenary Session 
2.Interometric Techniques II 
3.Digital Holography and Holographic Microscopy 
4.OCT and Coherence Scanning 
5.High-Speed Techniques 
6.Fringe Projection I 
   Posters--Tuesday 
7.Fringe Projection II 
8.Special Session.Spectroscopic Techniques in Industrial and Astronomical Applications 
9.High-Resolution Profiling I 
   SPIE Plenary Session 
10.High-Resolution Profiling II 
11.Joint Session I.High-Precision Measurement of Optical Components and Systems 
12.Joint Session II.High-Precision Measurement of Optical Components and Systems 
13.Speckle Metrology 
14.In-situ and Nondestructive Testing I 
15.In-situ and Nondestructive Testing II 
16.In-situ and Nondestructive Testing III