EWDTS-2017 explores the novel trends in testing, diagnosis, repair of microelectronic systems, and also cyber security, automotive, IoT, artificial intelligence.
EWDTS-2017 topics:
Analog, Mixed-Signal and RF Test
ATPG and High-Level TPG
Automotive Reliability & Test
Built-In Self Test
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design Verification and Validation
EDA Tools for Design and Test
Embedded Software
Failure Analysis & Fault Modeling
Functional Safely
High-level Synthesis
High-Performance Networks and Systems on a Chip
Internet of Things Design & Test
Low-power Design
Memory and Processor Test
Modeling & Fault Simulation
Network-on-Chip Design & Test
Flexible and Printed Electronics
Applied Electronics – Automotive/Mechatronics
Algorithms
Object-Oriented System Specification and Design
On-Line Testing
Power Issues in Design & Test
Real Time Embedded Systems
Reliability of Digital Systems
Scan-Based Techniques
Self-Repair and Reconfigurable Architectures
Signal and Information Processing in Radio and Communication Engineering
Neural networks in nonlinear signal, video and audio processing and technical optimization tasks
System Level Modeling, Simulation & Test Generation
System-in-Package and 3D Design & Test
Using UML for Embedded System Specification
Optical signals in communication and Information Processing
CAD and EDA Tools, Methods and Algorithms
Hardware Security and Design for Security
Logic, Schematic and System Synthesis
Place and Route
Thermal and Electrostatic Analysis of SoCs
Wireless and RFID Systems Synthesis
Sensors and Transducers
Medical Electronics
Design of Integrated Passive Components
09月29日
2017
10月02日
2017
摘要截稿日期
初稿截稿日期
初稿录用通知日期
终稿截稿日期
注册截止日期
2016年09月09日 保加利亚 Varna, Bulgaria
2016 IEEE East-West Design & Test Symposium2013年09月27日 俄罗斯
2013 11th East-West Design and Test Symposium
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