In test, we use data every day. Yield data, throughput data, statistical data, reliability data, outlier data, general production data are all in everyday use. However, data means much more than that. Advances in our industry allow data from wafer fab to be reused in studying system level test results. Field failure studies now routinely uses wafer probe data to understand root cause. Data has now become a product life cycle requirement—cradle to grave. Today access to the data has become an issue; the control and sharing of data among business partners. How to efficiently process data to extract the golden nuggets of useful information amid the gigabytes of unimportant noise remains a focus and a challenge for test professionals.
The Organizing Committee for the DATA-2017 Workshop is soliciting papers in: semiconductor test, yield analysis, product learning, and quality improvement. Of particular interest are advanced techniques and new tools for the use of data during the entire product life cycle, with special attention to how data can be used to change and alter test flows and decisions (adaptive test). Preference will be given to real-world case studies. Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style “Spot-Light” presentations describing industrial experiences or research are also invited.
Real Time Analysis Methods
Real Time Test Process Monitoring
Yield Learning and Analysis
Analog Fault Modeling and Coverage
Analog Effects in Digital Logic
Embedded Instrumentation (iJTAG)
Advanced DPPM Reduction & Reliability Improvement Techniques
Data Acquisition & Transport
Adaptive Test for Product Engineers
Data Analysis methods, Including
Multivariate Data
Fault Localization and Diagnosis
Data Storage and Security
I/O Test, Tuning, and Adjustment
Product and Project Case studies
11月02日
2017
11月03日
2017
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