International Conference on Electronic Measurement & Instruments (ICEMI) is the world's premier conference, and is convened every two years. It dedicated to the electronic test of devices, boards and systems----covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.
The IEEE 13th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 20-23 October, 2017, in Yangzhou, China.
International Conference on Electronic Measurement & Instruments(ICEMI)is sponsored by China Instrument and Control Society and held every two years. As the world’s premier conference, ICEMI dedicated to the electronic test of devices, modules and systems which is covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.
he IEEE 13th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 20-23 October, 2017, in Yangzhou, China. Prospective authors are invited to submit original, unpublished papers describing recent work in any of the following areas,but are not limited to:
Measurement & Test Information Acquisition and Transmission
Sensors and Transducers
Non-electric Measurement
Sensor Network
Data Acquisition System and Technology
Signal Transmission and Data Bus
Networks in Test and Measurement
IOT: Internet of Things
Cyber Physical System
Measurement & Test Information Processing
Sensors Fusion
Signal Analysis and Processing
Image Processing
Measurement System and Theory
Measurement Error Theory
Virtual Measurement
Machine Learning and Pattern Recognition
Intelligent Optimization and Applications
Data Mining
Massive Data Management and Analysis
Modeling and Simulation
Reconfigurable Computing
Measurement, Instruments & Test
Virtual Instrument
Microprocessor and Embedded System
VLSI Testing and Fault Diagnosis
MEMS Instruments and Test System
Testability and Built-in-test
Electronic Instrument & Measurement System
Optical Instrument & Measurement System
Precision Instruments & Measurement System
Scientific Experiment and Analytic Instrument
Educational Instrument & Experimental System
Software Technology
Embedded System Software
Test System Software
Software Test and Reliability
Condition Monitoring and Health Management
System Condition Monitoring
Component and System Reliability
Component and System Fault Diagnosis
Prognostics and Health Management
System Health Management
Calibration and Traceability
Quantum standards to fundamental constants and the international system of units
DC/Low Frequency measurement standards and calibration set
High Frequency measurement standards and calibration set
Calibration for electromagnetic properties of materials
Uncertainty evaluation
International or regional comparison
Instrument & Measurement in Research & Engineering
Simulation and Experimental Technology
Physical, Chemical and Biological Field
Material & Electro-mechanical Engineering
Energy and Power Engineering
Communication Technology
Aerospace & Avionics & Navigation
Automobile Engineering
Environmental Engineering
Biomedical Instrument and Application
Bioassay
Biometric
Industrial Process Control
Robots
Safety Monitoring Instruments and Systems
Others
The papers will be reviewed by the Technical Program Committee of ICEMI’2017. The authors of accepted full-text papers will be obliged to guarantee that they register for the conference, pay registration fees, attend the conference, and present their papers. All the accepted papers will be published on IEEE Proceedings.
10月20日
2017
10月23日
2017
初稿录用通知日期
初稿截稿日期
终稿截稿日期
注册截止日期
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